Wavefront sensing based on rotated lateral shearing interferometry
Optics Communications, Volume 281, Issue 2, 15 Jan 2008, 210-216.
doi:10.1016/j.optcom.2007.09.025
M. Schwertner, M. J. Booth & T. Wilson
We describe a self-referencing method of wavefront sensing based on rotated lateral shearing interferometry which is able to measure the local slope of a wavefront. We describe the principle of operation, suggest a number of practical implementations, and present experimental results. We found the difference between two sequential measurements of a nominally flat wavefront to be better than k/250 root mean square.
som_2008_1.PDF — PDF document, 474Kb