A method for characterizing longitudinal chromatic aberration of microscope objectives using a confocal optical system

J MICROSC-OXFORD 195: 17-22 Part 1 JUL 1999 Juskaitis R, Wilson T

We describe a novel method of characterizing the longitudinalchromatic aberration of microscope objectives byrecording a series of axial responses as a function ofwavelength as a plane reflector is scanned through the focalregion of a confocal microscope. Measurements arepresented for a variety of objectives with differing degreesof correction. The use of the chromatic focal shift tomeasure surface profiles is also discussed.

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