Professor Philip Withers FREng, University of Manchester

Correlative Tomography - Spanning Length and Timescales
When May 05, 2015
from 02:00 PM to 03:00 PM
Where LR8, IEB Building, Engineering Science
Contact Name
Contact Phone 01865-273925
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Together non destructive (X-ray) and destructive (serial section electron microscopy) enable us to probe materials behavior across a very wide range of lengthscales and timescales.  In this presentation I will describe the multi-scale 3D characterization workflows combining macroscale X-ray computed tomography (CT), micro X-ray CT, nanoscale serial section FIB/SEM imaging and analysis, and scanning transmission electron microscopy to study a range of materials degradation and repair processes. This approach allows us to travel down the scales to better understand macroscale damage in terms of the underlying microstructure and to co-visualise structural, stress fields, crystallographic (EBSD) and chemical (EDS) information.  This approach is particularly powerful when trying to develop a multiscale understanding of degradation form fatigue cracking, through creep cavitation to corrosion.  Examples will be drawn from the aerospace, nuclear and oil and gas sectors. Future workflows and visualization software advances will enable the materials scientist to bring together multiple scales and information or undertake high resolution imaging with a high degree of knowledge of the local context.

Finally, the three pillars of materials science (microstructure-chemistry-performance) are traditionally studied separately in the microscopy suite, the chemistry lab and the mechanical test facility on different samples.  Correlative techniques currently allow one to bring them all into registry in three dimensions.