Professor Toshimitsu Yokobori, Graduate School of Engineering, Tohoku University, Japan

Potential driven particle diffusion theory and its application to engineering problems
When Nov 18, 2013
from 02:00 PM to 03:00 PM
Where LR8
Contact Name
Contact Phone 01865-283302
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There is an extensive range of practical engineering problems in which diffusion plays an important role.  This includes mechanisms of hydrogen diffusion which causes embrittlement, micro crack initiation and growth under high temperature creep conditions and electro-migration due to vacancy diffusion in LSI circuits.  In this presentation, numerical methods are described for the simulation of diffusion under a potential gradient.  Results are presented and discussed for the problems of hydrogen embrittlement, vacancy diffusion which results in creep deformation and damage development in the form of microcracks, and failure of interconnects in LSI circuits.  The effect of temperature and concentration (of hydrogen or vacancies) is discussed based on the proposed analysis.  Furthermore, the way in which hydrogen diffusion and concentration influence fatigue behaviour under cyclic loading conditions is discussed and some engineering significances are proposed.